Gain and Offset-Calibrated 3-State Phase Detector:

• Utilizes calibrated gain and offset parameters to accurately measure phase differences between signals, crucial for high-frequency signal processing ICs.

Error-Compensating Circuit Architecture:

• Utilizes a weighted sum of input voltages and one-port networks to achieve tunable delays.

Integrated Circuit Chip for Phase Error Measurement:

• Develops specialized chips capable of directly measuring phase errors without requiring a reference signal, enabling precise phase correction in various applications.

System-on-Chip Implementation:

• Integrates phase error measurement functionality into system-on-chip architectures, streamlining the design process and enhancing the efficiency of signal processing systems.

Application in SSB Up/Down Converters and Phase Modulators:

• Addresses specific needs in communication devices by detecting and correcting phase errors in local oscillator signals and output signals, thereby improving overall system performance.