Industrial Consultancy & Sponsored Research (IC&SR) , IIT Madras
System for Optoelectronic Characterization of Solid-state Photodetectors
Categories for this Invention
Technology: Optoelectronic characterisation of solid-state photodetectors
Category: Photonics/Assistive, Test Equipment & Design Manufacturing
Industry: Electronic System & Design Manufacturing (ESDM)
Application: Photodetector and phototransistor analysis, dark current analysis
Market: The global market size is expected to reach USD 1.64 trillion in 2024 and grow at a CAGR of 6.5% to reach USD 2.25 trillion by 2029.
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Problem Statement
- Precise Testing: Photodetectors require precise testing conditions to avoid ambient light interference, which can affect performance assessments.
- Conventional dark rooms seal off devices from outside light, ensuring accurate measurements.
- The need for a customized dark chamber arises from the complexity and sensitivity of optoelectronic devices.
- Present light sources include solar simulators and high-cost LED-based sources.
- Commercial setups are costly and sophisticated, with applications including photovoltaic characterization, photodetector and phototransistor analysis, and more.
- The invention aims to address the limitations of existing dark chambers by introducing a novel design optimized for comprehensive testing of optoelectronic devices.
Technology
- The system consists of a dark chamber with a disc turret for holding multiple light sources, concentrator tubes, and collimators.
- The analyzer is connected to a display device. Most components are developed using 3D printing with black filament to minimize light reflections within the chamber.
- A sample holder with vacuum suction is placed inside the chamber, and two or more probes can be used to set contact with the parametric analyzer.
- The turret can be rotated to position the light source.
Key Features / Value Proposition
Spectral Range for Illumination and Material Selection
- Utilizes UV, visible, or IR light sources for testing wavelengths.
- Features a multi-wavelength source holder for easy switching between light sources.
Material Selection and Coating
- Dark chamber material chosen for low-cost setup, ensuring structural integrity and minimizing interference.
- Internal coating done with light-absorbing non-reflecting black powder coating to minimize reflection and scattering.
Sample Position and Light-Tight Construction
- Dedicated sample holder with suction facility for sample holding.
- Light source motion in z-direction, confirmed using swivel lock and brackets.
Features of the Invention
- Follows QCQA for faster photodetector diagnosis.
Customized Probing Solutions
- Electrical probes attached to dark chamber for easy contact with sample.
- Two-probe and four-probe measurement setups available.
Intensity Checker
- Solar meter attached to dark chamber to measure light intensity.
Modularity and Adaptability
- Easy adjustment of light wavelength, total exposure duration, and intensity.
Ability
- Cheap and adjustable illumination system for precise control of light intensity.
- Illumination source tailored to specific spectral range.
Questions about this Technology?
Contact For Licensing
sm-marketing@imail.iitm.ac.in
ipoffice2@iitm.ac.in
Research Lab
Prof. Parasuraman Swaminathan
Department of Metallurgical and Materials Engineering
Intellectual Property
IITM IDF Ref. 2766
Patent No: IN 548386
Technology Readiness Level
TRL- 4
Experimentally validated in Lab;